製品

This equipment is designed to inspect surface defects of SMT components like Capacitors, Inductors, Resistors or IC chips from at least 6 different angles simultaneously. It can be further customized to inspect up to 10 different angles. 
该设备旨在同时从至少 6 个不同角度检查 SMT 元件（如电容器、电感器、电阻器或 IC 芯片）的表面缺陷。它可以进一步定制以检查多达 10 个不同的角度。

Unlikely traditional systems that rely on users to define defect parameters, this tool is equipped with a AI system coupled with Optical modules with self-learning capabilities to identify and classify new / previous unknown defects. 
与依赖用户定义缺陷参数的传统系统不同，该工具配备了 AI 系统，并配有具有自学习功能的光学模块，可以识别和分类新的/以前的未知缺陷。

With an inspection speed of up to 10,000 components per minute, it can process high volumes with a defect detection success rate of up to 99% and reduce QC Inspection failures.
它的检查速度高达每分钟 10,000 个组件，可以处理大量缺陷，缺陷检测成功率高达 99%，并减少 QC 检查失败。