ADC Intelligent Defect Classification System

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Designed to work with AOI Systems, it can be integrated into existing AOI equipment. With a powerful AI Engine, Training and Predictive Modules, it enhances product inspection with the following advantages.
它专为与 AOI 系统配合使用而设计,可集成到现有的 AOI 设备中。凭借强大的 AI 引擎、训练和预测模块,它可增强产品检测,具有以下优势。

  • Instant and accurate classification of defective products 即时准确地对缺陷产品进行分类
  • Real time tracking of production lines 实时跟踪生产线
  • Improves production yield 提高生产良率
  • Reduce personnel and failure analysis costs 减少人员和故障分析成本
  • Gear towards Industry 4.0 面向工业 4.0


Suitable for Semiconductor Wafers, OLED Panels and Touch Panels AOI Inspection and other applications.
适用于半导体晶圆、OLED 面板和触摸屏 AOI 检测和其他应用。